Name: ATOMIC FORCE MICROSCOPY IMAGING MEASURING AND MANIPULATING SURFACES AT THE ATOMIC SCALE (HB 2016)
Brand: CBS Publishers and Distributors
SKU: 9789535104148
Rating: 5 (0 reviews)

Descriptions

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.